Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application

L Shi, S Nihtianov, F Scholze, LK Nanver

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 38th Annual Conference on IEEE Industrial Electronics Society
EditorsL Gomes, LG Chakraborty, D Irwin
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages3952-3957
Number of pages6
ISBN (Print)978-1-4673-2419-9
DOIs
Publication statusPublished - 2012
EventIEEE IECON 2012, Montreal, Canada - Piscataway, NJ, USA
Duration: 25 Oct 201228 Oct 2012

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE IECON 2012, Montreal, Canada
Period25/10/1228/10/12

Keywords

  • Conf.proc. > 3 pag

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