Electromigration and 1/f noise in single-crystalline, bamboo and polycrystalline Al lines

MJC van de Homberg, PFA Alkemade, AH Verbruggen, AG Dirks, E Ochs, S Radelaar

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationMaterials Research Society Sumposium Proceedings
    EditorsJJ Clement, R Keller, KS Krisch, ZG Suo
    Pages211-216
    Number of pages6
    Publication statusPublished - 1997

    Cite this

    van de Homberg, MJC., Alkemade, PFA., Verbruggen, AH., Dirks, AG., Ochs, E., & Radelaar, S. (1997). Electromigration and 1/f noise in single-crystalline, bamboo and polycrystalline Al lines. In JJ. Clement, R. Keller, KS. Krisch, & ZG. Suo (Eds.), Materials Research Society Sumposium Proceedings (pp. 211-216)