Electromigration and 1/f noise in single-crystalline, bamboo and polycrystalline Al lines

MJC van de Homberg, PFA Alkemade, AH Verbruggen, AG Dirks, E Ochs, S Radelaar

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationMaterials Research Society Sumposium Proceedings
    EditorsJJ Clement, R Keller, KS Krisch, ZG Suo
    Number of pages6
    Publication statusPublished - 1997

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