Electron wave front modulation with patterned mirrors

Research output: ThesisDissertation (TU Delft)

6 Downloads (Pure)

Abstract

We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum electron microscopy (QEM) and multi-pass transmission electron microscopy (MP-TEM), or structural hypothesis testing.
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Kruit, P., Supervisor
Award date15 Mar 2021
Print ISBNs978-94-6384-202-0
DOIs
Publication statusPublished - 15 Mar 2021

Keywords

  • Electron microscopy
  • Wave front modulation
  • Electron mirror
  • Aberration correction
  • Electron beam separator

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