Electron wave front modulation with patterned mirrors

Research output: ThesisDissertation (TU Delft)

15 Downloads (Pure)


We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum electron microscopy (QEM) and multi-pass transmission electron microscopy (MP-TEM), or structural hypothesis testing.
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
  • Kruit, P., Supervisor
Award date15 Mar 2021
Print ISBNs978-94-6384-202-0
Publication statusPublished - 15 Mar 2021


  • Electron microscopy
  • Wave front modulation
  • Electron mirror
  • Aberration correction
  • Electron beam separator


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