Electron wave front modulation with patterned mirrors

M.A.R. Krielaart

doi:10.4233/uuid:285e9079-e12c-4cd4-9a34-555bf66237c7

Electron wave front modulation with patterned mirrors

M.A.R. Krielaart

ImPhys/Microscopy Instrumentation & Techniques

Research output: Thesis › Dissertation (TU Delft)

27 Downloads (Pure)

Abstract

We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum electron microscopy (QEM) and multi-pass transmission electron microscopy (MP-TEM), or structural hypothesis testing.

Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Delft University of Technology
Supervisors/Advisors	Kruit, P., Supervisor
Award date	15 Mar 2021
Print ISBNs	978-94-6384-202-0
DOIs	https://doi.org/10.4233/uuid:285e9079-e12c-4cd4-9a34-555bf66237c7
Publication status	Published - 15 Mar 2021

Keywords

Electron microscopy
Wave front modulation
Electron mirror
Aberration correction
Electron beam separator

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10.4233/uuid:285e9079-e12c-4cd4-9a34-555bf66237c7

Electron wave front modulation with patterned mirrorsFinal published version, 21.7 MB

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title = "Electron wave front modulation with patterned mirrors",

abstract = "We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum electron microscopy (QEM) and multi-pass transmission electron microscopy (MP-TEM), or structural hypothesis testing.",

keywords = "Electron microscopy, Wave front modulation, Electron mirror, Aberration correction, Electron beam separator",

author = "M.A.R. Krielaart",

year = "2021",

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type = "Dissertation (TU Delft)",

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AU - Krielaart, M.A.R.

PY - 2021/3/15

Y1 - 2021/3/15

N2 - We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum electron microscopy (QEM) and multi-pass transmission electron microscopy (MP-TEM), or structural hypothesis testing.

AB - We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum electron microscopy (QEM) and multi-pass transmission electron microscopy (MP-TEM), or structural hypothesis testing.

KW - Electron microscopy

KW - Wave front modulation

KW - Electron mirror

KW - Aberration correction

KW - Electron beam separator

U2 - 10.4233/uuid:285e9079-e12c-4cd4-9a34-555bf66237c7

DO - 10.4233/uuid:285e9079-e12c-4cd4-9a34-555bf66237c7

M3 - Dissertation (TU Delft)

SN - 978-94-6384-202-0

ER -

Electron wave front modulation with patterned mirrors

Abstract

Keywords

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