Environmental stress cracking in Arnitel U 2000/35, influence of pre-load and pre-expo.

NB Kuipers, M Janssen, FA Veer, P Klop, D Schoone

Research output: Book/Report › Report › Professional

Original language	Undefined/Unknown
Place of Publication	Delft
Publisher	Delft University of Technology i.o.v. DSM
Number of pages	53
Publication status	Published - 2002

Name
Publisher	Delft University of Technology i.o.v. DSM

juni 2002

Keywords

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title = "Environmental stress cracking in Arnitel U 2000/35, influence of pre-load and pre-expo.",

keywords = "Geen BTA classificatie",

author = "NB Kuipers and M Janssen and FA Veer and P Klop and D Schoone",

note = "juni 2002",

year = "2002",

language = "Undefined/Unknown",

publisher = "Delft University of Technology i.o.v. DSM",

}

TY - BOOK

T1 - Environmental stress cracking in Arnitel U 2000/35, influence of pre-load and pre-expo.

AU - Kuipers, NB

AU - Janssen, M

AU - Veer, FA

AU - Klop, P

AU - Schoone, D

N1 - juni 2002

PY - 2002

Y1 - 2002

KW - Geen BTA classificatie

M3 - Report

BT - Environmental stress cracking in Arnitel U 2000/35, influence of pre-load and pre-expo.

PB - Delft University of Technology i.o.v. DSM

CY - Delft

ER -