Environmental stress cracking in Arnitel U 2000/35, influence of pre-load and pre-expo.

NB Kuipers, M Janssen, FA Veer, P Klop, D Schoone

    Research output: Book/ReportReportProfessional

    Original languageUndefined/Unknown
    Place of PublicationDelft
    PublisherDelft University of Technology i.o.v. DSM
    Number of pages53
    Publication statusPublished - 2002

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    Name
    PublisherDelft University of Technology i.o.v. DSM

    Keywords

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