Exploiting Count Spectra for Bayesian Fault Localization

RF Lima Maranhao De Abreu; A Gonzalez Sanchez; AJC van Gemund

Exploiting Count Spectra for Bayesian Fault Localization

RF Lima Maranhao De Abreu, A Gonzalez Sanchez, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

12 Citations (Scopus)

Original language	English
Title of host publication	PROMISE'10: 6th International Conference on Predictive Models in Software Engineering
Editors	T Menzies
Place of Publication	New York, NY, USA
Publisher	Association for Computing Machinery (ACM)
Pages	1-22
Number of pages	22
ISBN (Print)	978-1-4503-0404-7
Publication status	Published - 2010
Event	PROMISE'10: 6th International Conference on Predictive Models in Software Engineering - New York, NY, USA Duration: 12 Sept 2010 → 13 Sept 2010

Publication series

Name
Publisher	ACM Press

Conference

Conference	PROMISE'10: 6th International Conference on Predictive Models in Software Engineering
Period	12/09/10 → 13/09/10

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{674e87fb55fd48848358bc36fd770a63,

title = "Exploiting Count Spectra for Bayesian Fault Localization",

keywords = "Conf.proc. > 3 pag",

author = "{Lima Maranhao De Abreu}, RF and {Gonzalez Sanchez}, A and {van Gemund}, AJC",

year = "2010",

language = "English",

isbn = "978-1-4503-0404-7",

publisher = "Association for Computing Machinery (ACM)",

pages = "1--22",

editor = "T Menzies",

booktitle = "PROMISE'10: 6th International Conference on Predictive Models in Software Engineering",

address = "United States",

note = "PROMISE'10: 6th International Conference on Predictive Models in Software Engineering ; Conference date: 12-09-2010 Through 13-09-2010",

}

Lima Maranhao De Abreu, RF, Gonzalez Sanchez, A & van Gemund, AJC 2010, Exploiting Count Spectra for Bayesian Fault Localization. in T Menzies (ed.), PROMISE'10: 6th International Conference on Predictive Models in Software Engineering. Association for Computing Machinery (ACM), New York, NY, USA, pp. 1-22, PROMISE'10: 6th International Conference on Predictive Models in Software Engineering, 12/09/10.

Exploiting Count Spectra for Bayesian Fault Localization. / Lima Maranhao De Abreu, RF; Gonzalez Sanchez, A; van Gemund, AJC.
PROMISE'10: 6th International Conference on Predictive Models in Software Engineering. ed. / T Menzies. New York, NY, USA: Association for Computing Machinery (ACM), 2010. p. 1-22.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Exploiting Count Spectra for Bayesian Fault Localization

AU - Lima Maranhao De Abreu, RF

AU - Gonzalez Sanchez, A

AU - van Gemund, AJC

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4503-0404-7

SP - 1

EP - 22

BT - PROMISE'10: 6th International Conference on Predictive Models in Software Engineering

A2 - Menzies, T

PB - Association for Computing Machinery (ACM)

CY - New York, NY, USA

T2 - PROMISE'10: 6th International Conference on Predictive Models in Software Engineering

Y2 - 12 September 2010 through 13 September 2010

ER -