Exploiting Count Spectra for Bayesian Fault Localization

RF Lima Maranhao De Abreu, A Gonzalez Sanchez, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

7 Citations (Scopus)
Original languageEnglish
Title of host publicationPROMISE'10: 6th International Conference on Predictive Models in Software Engineering
EditorsT Menzies
Place of PublicationNew York, NY, USA
PublisherAssociation for Computing Machinery (ACM)
Pages1-22
Number of pages22
ISBN (Print)978-1-4503-0404-7
Publication statusPublished - 2010
EventPROMISE'10: 6th International Conference on Predictive Models in Software Engineering - New York, NY, USA
Duration: 12 Sep 201013 Sep 2010

Publication series

Name
PublisherACM Press

Conference

ConferencePROMISE'10: 6th International Conference on Predictive Models in Software Engineering
Period12/09/1013/09/10

Keywords

  • Conf.proc. > 3 pag

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