Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.

S van Haver; AJEM Janssen; P. Dirksen; JJM Braat

Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.

S van Haver, AJEM Janssen, P. Dirksen, JJM Braat

ImPhys/Optics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the EOS Advanced Imaging Techniques
Editors	M. Kolobob, V. Devlaminck, P. Torok
Place of Publication	Hannover
Publisher	EOS
Pages	1-4
Number of pages	4
Publication status	Published - 2007
Event	3rd EOSp Topical meeting an Advanced iamging Techniques - Hannover Duration: 12 Sep 2007 → 14 Sep 2007

Publication series

Name
Publisher	EOS

Conference

Conference	3rd EOSp Topical meeting an Advanced iamging Techniques
Period	12/09/07 → 14/09/07

Bibliographical note

Niet eerder opgenomen

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{b415ad219ead49238a404399eeab576a,

title = "Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "{van Haver}, S and AJEM Janssen and P. Dirksen and JJM Braat",

note = "Niet eerder opgenomen; null ; Conference date: 12-09-2007 Through 14-09-2007",

year = "2007",

language = "Undefined/Unknown",

publisher = "EOS",

pages = "1--4",

editor = "M. Kolobob and V. Devlaminck and P. Torok",

booktitle = "Proceedings of the EOS Advanced Imaging Techniques",

}

Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils. / van Haver, S; Janssen, AJEM; Dirksen, P. et al.

Proceedings of the EOS Advanced Imaging Techniques. ed. / M. Kolobob; V. Devlaminck; P. Torok. Hannover : EOS, 2007. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.

AU - van Haver, S

AU - Janssen, AJEM

AU - Dirksen, P.

AU - Braat, JJM

N1 - Niet eerder opgenomen

PY - 2007

Y1 - 2007

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 1

EP - 4

BT - Proceedings of the EOS Advanced Imaging Techniques

A2 - Kolobob, M.

A2 - Devlaminck, V.

A2 - Torok, P.

PB - EOS

CY - Hannover

Y2 - 12 September 2007 through 14 September 2007

ER -