Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.

S van Haver, AJEM Janssen, P. Dirksen, JJM Braat

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationProceedings of the EOS Advanced Imaging Techniques
EditorsM. Kolobob, V. Devlaminck, P. Torok
Place of PublicationHannover
PublisherEOS
Pages1-4
Number of pages4
Publication statusPublished - 2007
Event3rd EOSp Topical meeting an Advanced iamging Techniques - Hannover
Duration: 12 Sep 200714 Sep 2007

Publication series

Name
PublisherEOS

Conference

Conference3rd EOSp Topical meeting an Advanced iamging Techniques
Period12/09/0714/09/07

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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