Fast statistical analysis of RC nets subject to manufacturing variabilities

Y Bi, KJ van der Kolk, JF Villena, LM Silveira, NP van der Meijs

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	Design, Automation Test in Europe Conference Exhibition (DATE2011)
Editors	BM Al-Hashimi
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	1-6
Number of pages	6
ISBN (Print)	978-3-9810801-7-9
Publication status	Published - 2011
Event	Design, Automation Test in Europe Conference Exhibition (DATE2011) - Piscataway, NJ, USA Duration: 14 Mar 2011 → 18 Mar 2011

Name
Publisher	IEEE

Conference	Design, Automation Test in Europe Conference Exhibition (DATE2011)
Period	14/03/11 → 18/03/11

Cite this

@inproceedings{b0ca07027a2b46809bd1325f3b9431fb,

title = "Fast statistical analysis of RC nets subject to manufacturing variabilities",

author = "Y Bi and {van der Kolk}, KJ and JF Villena and LM Silveira and {van der Meijs}, NP",

year = "2011",

language = "English",

isbn = "978-3-9810801-7-9",

publisher = "IEEE Society",

pages = "1--6",

editor = "BM Al-Hashimi",

booktitle = "Design, Automation Test in Europe Conference Exhibition (DATE2011)",

note = "Design, Automation Test in Europe Conference Exhibition (DATE2011) ; Conference date: 14-03-2011 Through 18-03-2011",

}

Fast statistical analysis of RC nets subject to manufacturing variabilities. / Bi, Y; van der Kolk, KJ; Villena, JF et al.
Design, Automation Test in Europe Conference Exhibition (DATE2011). ed. / BM Al-Hashimi. Piscataway, NJ, USA: IEEE Society, 2011. p. 1-6.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Fast statistical analysis of RC nets subject to manufacturing variabilities

AU - Bi, Y

AU - van der Kolk, KJ

AU - Villena, JF

AU - Silveira, LM

AU - van der Meijs, NP

PY - 2011

Y1 - 2011

M3 - Conference contribution

SN - 978-3-9810801-7-9

SP - 1

EP - 6

BT - Design, Automation Test in Europe Conference Exhibition (DATE2011)

A2 - Al-Hashimi, BM

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - Design, Automation Test in Europe Conference Exhibition (DATE2011)

Y2 - 14 March 2011 through 18 March 2011

ER -