Fast Statistical analysis of RC Nets Subject tot Manufacturing Variabilities

Y Bi, KJ van der Kolk, JF Villena, LM Silveira, NP van der Meijs

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)

Abstract

ISBN: 978-3-9810801-7-9 ISSN: 1530-1591
Original languageEnglish
Title of host publicationIEEE Design, Automation and Test in Europe (DATE2011)
EditorsBM Al-Hashimi
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages32-37
Number of pages6
ISBN (Print)978-3-9810801-7-9
Publication statusPublished - 2011
EventDesign, Automation and Test in Europe (DATE2011) - Piscataway, NJ, USA
Duration: 14 Mar 201118 Mar 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceDesign, Automation and Test in Europe (DATE2011)
Period14/03/1118/03/11

Keywords

  • Conf.proc. > 3 pag

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