Fast Statistical analysis of RC Nets Subject tot Manufacturing Variabilities

Y Bi; KJ van der Kolk; JF Villena; LM Silveira; NP van der Meijs

Fast Statistical analysis of RC Nets Subject tot Manufacturing Variabilities

Y Bi, KJ van der Kolk, JF Villena, LM Silveira, NP van der Meijs

Signal Processing Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Abstract

ISBN: 978-3-9810801-7-9 ISSN: 1530-1591

Original language	English
Title of host publication	IEEE Design, Automation and Test in Europe (DATE2011)
Editors	BM Al-Hashimi
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	32-37
Number of pages	6
ISBN (Print)	978-3-9810801-7-9
Publication status	Published - 2011
Event	Design, Automation and Test in Europe (DATE2011) - Piscataway, NJ, USA Duration: 14 Mar 2011 → 18 Mar 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	Design, Automation and Test in Europe (DATE2011)
Period	14/03/11 → 18/03/11

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{bd4161e364e74aa599ad148767134245,

title = "Fast Statistical analysis of RC Nets Subject tot Manufacturing Variabilities",

abstract = "ISBN: 978-3-9810801-7-9 ISSN: 1530-1591",

keywords = "Conf.proc. > 3 pag",

author = "Y Bi and {van der Kolk}, KJ and JF Villena and LM Silveira and {van der Meijs}, NP",

year = "2011",

language = "English",

isbn = "978-3-9810801-7-9",

publisher = "IEEE Society",

pages = "32--37",

editor = "BM Al-Hashimi",

booktitle = "IEEE Design, Automation and Test in Europe (DATE2011)",

note = "Design, Automation and Test in Europe (DATE2011) ; Conference date: 14-03-2011 Through 18-03-2011",

}

Fast Statistical analysis of RC Nets Subject tot Manufacturing Variabilities. / Bi, Y; van der Kolk, KJ; Villena, JF et al.
IEEE Design, Automation and Test in Europe (DATE2011). ed. / BM Al-Hashimi. Piscataway, NJ, USA: IEEE Society, 2011. p. 32-37.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Fast Statistical analysis of RC Nets Subject tot Manufacturing Variabilities

AU - Bi, Y

AU - van der Kolk, KJ

AU - Villena, JF

AU - Silveira, LM

AU - van der Meijs, NP

PY - 2011

Y1 - 2011

N2 - ISBN: 978-3-9810801-7-9 ISSN: 1530-1591

AB - ISBN: 978-3-9810801-7-9 ISSN: 1530-1591

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-3-9810801-7-9

SP - 32

EP - 37

BT - IEEE Design, Automation and Test in Europe (DATE2011)

A2 - Al-Hashimi, BM

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - Design, Automation and Test in Europe (DATE2011)

Y2 - 14 March 2011 through 18 March 2011

ER -

Fast Statistical analysis of RC Nets Subject tot Manufacturing Variabilities

Abstract

Publication series

Conference

Keywords

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Cite this