Field of inserted charges during Scanning Electron Microscopy of non-conducting samples

T Amlaki, NV Budko, Eric Bosch, N Debernardi, U Ebert, V Leung, M Mink, C Prastani, S Sluyterman, Marieke Snelder, J Teunissen, BJ Thijsse, JM Thijssen

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings Physics with Industry 2011
    EditorsM Bartels, P Witte et al.
    Place of PublicationUtrecht, The Netherlands
    PublisherStichting FOM
    Number of pages15
    Publication statusPublished - 2011
    EventPhysics with Industry - Utrecht, The Netherlands
    Duration: 17 Oct 201121 Oct 2011

    Publication series

    PublisherStichting FOM


    ConferencePhysics with Industry


    • Conf.proc. > 3 pag

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