From image quality to atmosphere experience: How evolutions in technology impact experience assessment

IEJR Heynderickx; H de Ridder

doi:10.1117/12.2007223

From image quality to atmosphere experience: How evolutions in technology impact experience assessment

IEJR Heynderickx, H de Ridder

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of SPIE-IS&T Human Vision and Electronic Imaging XVIII :
Editors	BE Rogowitz, TN Pappas, H de Ridder
Place of Publication	Bellingham, WA, USA
Publisher	SPIE
Pages	1-9
Number of pages	9
ISBN (Print)	978-0819494245
DOIs	https://doi.org/10.1117/12.2007223
Publication status	Published - 2013
Event	Human Vision and Electronic Imaging XVIII, Burlingame, USA - Bellingham, WA, USA Duration: 4 Feb 2013 → 7 Feb 2013

Publication series

Name
Publisher	SPIE

Name	Proceedings of SPIE- International Society for Optical Engineering
Volume	8651
ISSN (Print)	0277-786X

Conference

Conference	Human Vision and Electronic Imaging XVIII, Burlingame, USA
Period	4/02/13 → 7/02/13

Access to Document

10.1117/12.2007223

Cite this

Heynderickx, IEJR., & de Ridder, H. (2013). From image quality to atmosphere experience: How evolutions in technology impact experience assessment. In BE. Rogowitz, TN. Pappas, & H. de Ridder (Eds.), Proceedings of SPIE-IS&T Human Vision and Electronic Imaging XVIII : (pp. 1-9). (Proceedings of SPIE- International Society for Optical Engineering; Vol. 8651). SPIE. https://doi.org/10.1117/12.2007223

Heynderickx, IEJR ; de Ridder, H. / From image quality to atmosphere experience: How evolutions in technology impact experience assessment. Proceedings of SPIE-IS&T Human Vision and Electronic Imaging XVIII :. editor / BE Rogowitz ; TN Pappas ; H de Ridder. Bellingham, WA, USA : SPIE, 2013. pp. 1-9 (Proceedings of SPIE- International Society for Optical Engineering).

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Heynderickx, IEJR & de Ridder, H 2013, From image quality to atmosphere experience: How evolutions in technology impact experience assessment. in BE Rogowitz, TN Pappas & H de Ridder (eds), Proceedings of SPIE-IS&T Human Vision and Electronic Imaging XVIII :. Proceedings of SPIE- International Society for Optical Engineering, vol. 8651, SPIE, Bellingham, WA, USA, pp. 1-9, Human Vision and Electronic Imaging XVIII, Burlingame, USA, 4/02/13. https://doi.org/10.1117/12.2007223

From image quality to atmosphere experience: How evolutions in technology impact experience assessment. / Heynderickx, IEJR; de Ridder, H.
Proceedings of SPIE-IS&T Human Vision and Electronic Imaging XVIII :. ed. / BE Rogowitz; TN Pappas; H de Ridder. Bellingham, WA, USA: SPIE, 2013. p. 1-9 (Proceedings of SPIE- International Society for Optical Engineering; Vol. 8651).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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AU - Heynderickx, IEJR

AU - de Ridder, H

PY - 2013

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DO - 10.1117/12.2007223

M3 - Conference contribution

SN - 978-0819494245

SP - 1

EP - 9

BT - Proceedings of SPIE-IS&T Human Vision and Electronic Imaging XVIII :

A2 - Rogowitz, BE

A2 - Pappas, TN

A2 - de Ridder, H

PB - SPIE

CY - Bellingham, WA, USA

T2 - Human Vision and Electronic Imaging XVIII, Burlingame, USA

Y2 - 4 February 2013 through 7 February 2013

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Heynderickx IEJR, de Ridder H. From image quality to atmosphere experience: How evolutions in technology impact experience assessment. In Rogowitz BE, Pappas TN, de Ridder H, editors, Proceedings of SPIE-IS&T Human Vision and Electronic Imaging XVIII :. Bellingham, WA, USA: SPIE. 2013. p. 1-9. (Proceedings of SPIE- International Society for Optical Engineering). doi: 10.1117/12.2007223