Original language | English |
---|---|
Pages (from-to) | 1-5 |
Number of pages | 5 |
Journal | Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures |
Volume | 33 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2015 |
Helium ion beam induced growth of hammerhead AFM probes
G Nanda, E van Veldhoven, D Maas, H Sadeghian, PFA Alkemade
Research output: Contribution to journal › Article › Scientific › peer-review
12
Citations
(Scopus)