High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
128 Downloads (Pure)

Abstract

High Impedance Fault (HIF) is a low fault current event which cannot always be efficiently detected or cleared by conventional protection systems. Voltage or current signal distortions are often a possible indicator of HIF signatures which need to be carefully analyzed. This paper proposes a new technique based on second-difference approach to detect signal distortions. The technique does not require large database and is computationally very lightweight. The performance of the proposed technique is compared against commercial protection relays connected in Hardware-in-Loop (HIL) mode to a Real Time Digital Simulator (RTDS) simulating HIF in an IEEE 9-bus system. Test result evaluation show that the proposed technique is accurate and dependable.
Original languageEnglish
Title of host publicationProceedings IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
Place of PublicationPiscataway, NJ
PublisherIEEE
Pages182-187
Number of pages6
ISBN (Electronic)978-1-5090-6684-1
DOIs
Publication statusPublished - 2018
EventIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society - Omni Shoreham Hotel, Washington D.C., United States
Duration: 21 Oct 201823 Oct 2018
Conference number: 44
http://www.iecon2018.org/

Conference

ConferenceIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
Abbreviated titleIECON
CountryUnited States
CityWashington D.C.
Period21/10/1823/10/18
Internet address

Keywords

  • High Impedance Fault
  • Power system protection
  • Waveform analytics
  • Distortion detection
  • Power system reliabilty

Fingerprint

Dive into the research topics of 'High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing'. Together they form a unique fingerprint.

Cite this