@inproceedings{36e1bda0f5cf48eaa56646098fd058c6,
title = "High-reflection microprismatic material as a base for passive reference marks in machine vision metrology applications",
keywords = "Machine vision, Mark position estimation, Microprismatic retrore ective tape, Reference mark, Retrore ectivity",
author = "Trushkina, {Anna V.} and Vasilev, {Aleksandr S.} and Serikova, {Mariya G.} and Anisimov, {Andrei G.}",
year = "2017",
month = jan,
day = "1",
doi = "10.1117/12.2269426",
language = "English",
volume = "10334",
editor = "J. Beyerer and {Puente Le{\'o}n}, F.",
booktitle = "Automated Visual Inspection and Machine Vision II",
}