High-reflection microprismatic material as a base for passive reference marks in machine vision metrology applications

Anna V. Trushkina, Aleksandr S. Vasilev, Mariya G. Serikova, Andrei G. Anisimov

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
65 Downloads (Pure)
Original languageEnglish
Title of host publicationAutomated Visual Inspection and Machine Vision II
EditorsJ. Beyerer, F. Puente León
Number of pages7
Volume10334
DOIs
Publication statusPublished - 1 Jan 2017

Keywords

  • Machine vision
  • Mark position estimation
  • Microprismatic retrore ective tape
  • Reference mark
  • Retrore ectivity

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