High-resolution, integrated full wavefield migration of 3D surface seismic and VSP data

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

    Original languageEnglish
    Title of host publicationDelphi; The Reservoir Characterization and Monitoring Project (2015)
    Subtitle of host publicationFrom seismis measurements to rock and pore parameters
    EditorsBerkhout A.J., Verschuur D.J.
    Place of PublicationDelft
    PublisherDelft University of Technology
    Number of pages10
    ISBN (Print)978-90-73817-65-4
    Publication statusPublished - Jan 2016

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