Higher-order tunnelling processes and enhanced shot noise in superconducting tunnel devices

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the Society of Photo-Optical Instrumentation Engineers (SPIE)
    EditorsMB Weismann, NE Israeloff, AS Kogan
    Place of PublicationWashington - USA
    PublisherSPIE
    Pages185-195
    Number of pages11
    ISBN (Print)0-8194-4972-5
    Publication statusPublished - 2003
    EventSPIE - Noise as a tool for studying materials; Santa Fe, New Mexico, USA - Washington - USA
    Duration: 2 Jun 20034 Jun 2003

    Publication series

    Name
    PublisherSPIE
    Name
    Volume5112

    Conference

    ConferenceSPIE - Noise as a tool for studying materials; Santa Fe, New Mexico, USA
    Period2/06/034/06/03

    Keywords

    • Conf.proc. > 3 pag

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