Higher-order tunnelling processes and enhanced shot noise in superconducting tunnel devices

TM Klapwijk

Higher-order tunnelling processes and enhanced shot noise in superconducting tunnel devices

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the Society of Photo-Optical Instrumentation Engineers (SPIE)
Editors	MB Weismann, NE Israeloff, AS Kogan
Place of Publication	Washington - USA
Publisher	SPIE
Pages	185-195
Number of pages	11
ISBN (Print)	0-8194-4972-5
Publication status	Published - 2003
Event	SPIE - Noise as a tool for studying materials; Santa Fe, New Mexico, USA - Washington - USA Duration: 2 Jun 2003 → 4 Jun 2003

Publication series

Name
Publisher	SPIE

Name
Volume	5112

Conference

Conference	SPIE - Noise as a tool for studying materials; Santa Fe, New Mexico, USA
Period	2/06/03 → 4/06/03

Bibliographical note

Klapwijk

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{935863206b2147618689e80ee0fa0c4b,

title = "Higher-order tunnelling processes and enhanced shot noise in superconducting tunnel devices",

keywords = "Conf.proc. > 3 pag",

author = "TM Klapwijk",

note = "Klapwijk; SPIE - Noise as a tool for studying materials; Santa Fe, New Mexico, USA ; Conference date: 02-06-2003 Through 04-06-2003",

year = "2003",

language = "Undefined/Unknown",

isbn = "0-8194-4972-5",

publisher = "SPIE",

pages = "185--195",

editor = "MB Weismann and NE Israeloff and AS Kogan",

booktitle = "Proceedings of the Society of Photo-Optical Instrumentation Engineers (SPIE)",

address = "United States",

}

Higher-order tunnelling processes and enhanced shot noise in superconducting tunnel devices. / Klapwijk, TM.
Proceedings of the Society of Photo-Optical Instrumentation Engineers (SPIE). ed. / MB Weismann; NE Israeloff; AS Kogan. Washington - USA: SPIE, 2003. p. 185-195.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Higher-order tunnelling processes and enhanced shot noise in superconducting tunnel devices

AU - Klapwijk, TM

N1 - Klapwijk

PY - 2003

Y1 - 2003

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-8194-4972-5

SP - 185

EP - 195

BT - Proceedings of the Society of Photo-Optical Instrumentation Engineers (SPIE)

A2 - Weismann, MB

A2 - Israeloff, NE

A2 - Kogan, AS

PB - SPIE

CY - Washington - USA

T2 - SPIE - Noise as a tool for studying materials; Santa Fe, New Mexico, USA

Y2 - 2 June 2003 through 4 June 2003

ER -