TY - GEN
T1 - Improving Side-Channel Analysis Through Semi-Supervised Learning
AU - Picek, Stjepan
AU - Heuser, Annelie
AU - Jovic, Alan
AU - Knezevic, Karlo
AU - Richmond, Tania
PY - 2019
Y1 - 2019
N2 - The profiled side-channel analysis represents the most powerful category of side-channel attacks. In this context, the security evaluator (i.e., attacker) gains access to a profiling device to build a precise model which is used to attack another device in the attacking phase. Mostly, it is assumed that the attacker has significant capabilities in the profiling phase, whereas the attacking phase is very restricted. We step away from this assumption and consider an attacker restricted in the profiling phase, while the attacking phase is less limited. We propose the concept of semi-supervised learning for side-channel analysis, where the attacker uses a small number of labeled measurements from the profiling phase as well as the unlabeled measurements from the attacking phase to build a more reliable model. Our results show that the semi-supervised concept significantly helps the template attack (TA) and its pooled version (TAp). More specifically, for low noise scenario, the results for machine learning techniques and TA are often improved when only a small number of measurements is available in the profiling phase, while there is no significant difference in scenarios where the supervised set is large enough for reliable classification. For high noise scenario, TAp and multilayer perceptron results are improved for the majority of inspected dataset sizes, while for high noise scenario with added countermeasures, we show a small improvement for TAp, Naive Bayes and multilayer perceptron approaches for most inspected dataset sizes. Current results go in favor of using semi-supervised learning, especially self-training approach, in side-channel attacks.
AB - The profiled side-channel analysis represents the most powerful category of side-channel attacks. In this context, the security evaluator (i.e., attacker) gains access to a profiling device to build a precise model which is used to attack another device in the attacking phase. Mostly, it is assumed that the attacker has significant capabilities in the profiling phase, whereas the attacking phase is very restricted. We step away from this assumption and consider an attacker restricted in the profiling phase, while the attacking phase is less limited. We propose the concept of semi-supervised learning for side-channel analysis, where the attacker uses a small number of labeled measurements from the profiling phase as well as the unlabeled measurements from the attacking phase to build a more reliable model. Our results show that the semi-supervised concept significantly helps the template attack (TA) and its pooled version (TAp). More specifically, for low noise scenario, the results for machine learning techniques and TA are often improved when only a small number of measurements is available in the profiling phase, while there is no significant difference in scenarios where the supervised set is large enough for reliable classification. For high noise scenario, TAp and multilayer perceptron results are improved for the majority of inspected dataset sizes, while for high noise scenario with added countermeasures, we show a small improvement for TAp, Naive Bayes and multilayer perceptron approaches for most inspected dataset sizes. Current results go in favor of using semi-supervised learning, especially self-training approach, in side-channel attacks.
UR - http://www.scopus.com/inward/record.url?scp=85070751826&partnerID=8YFLogxK
U2 - 10.1007/978-3-030-15462-2_3
DO - 10.1007/978-3-030-15462-2_3
M3 - Conference contribution
AN - SCOPUS:85070751826
SN - 978-3-030-15461-5
VL - 11389
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 35
EP - 50
BT - Smart Card Research and Advanced Applications
A2 - Bilgin, Begül
A2 - Fischer, Jean-Bernard
PB - Springer
CY - Cham
T2 - 17th International Conference on Smart Card Research and Advanced Applications, CARDIS 2018
Y2 - 12 November 2018 through 14 November 2018
ER -