Influence of Concurrent Electrothermal and Avalanche Effects on the Safe Operating Area of Multifinger Bipolar Transistors

L la Spina, V d' Alessandro, S Russo, N Rinaldi, LK Nanver

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	483-491
Number of pages	9
Journal	IEEE Transactions on Electron Devices
Volume	56
Issue number	3
Publication status	Published - 2009

Keywords

@article{0a0da7bf07f14860984448d638ab1f53,

title = "Influence of Concurrent Electrothermal and Avalanche Effects on the Safe Operating Area of Multifinger Bipolar Transistors",

keywords = "CWTS 0.75 <= JFIS < 2.00",

author = "{la Spina}, L and {d' Alessandro}, V and S Russo and N Rinaldi and LK Nanver",

year = "2009",

language = "Undefined/Unknown",

volume = "56",

pages = "483--491",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

number = "3",

}

TY - JOUR

T1 - Influence of Concurrent Electrothermal and Avalanche Effects on the Safe Operating Area of Multifinger Bipolar Transistors

AU - la Spina, L

AU - d' Alessandro, V

AU - Russo, S

AU - Rinaldi, N

AU - Nanver, LK

PY - 2009

Y1 - 2009

KW - CWTS 0.75 <= JFIS < 2.00

M3 - Article

SN - 0018-9383

VL - 56

SP - 483

EP - 491

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 3

ER -