Insights to emitter saturation current densities of boron implanted samples based on defects simulations

KRC Mok, RCG Naber, LK Nanver

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

7 Citations (Scopus)

Original language	English
Title of host publication	AIP Conf. Proc. Vol. 1496, 19th International Conference on Ion Implantation Technology (IIT 2012)
Pages	245-248
Number of pages	4
DOIs	https://doi.org/10.1063/1.4766534
Publication status	Published - 2012

Name

Keywords

@inproceedings{88a622300a54471c987b7ddcf7964aa8,

title = "Insights to emitter saturation current densities of boron implanted samples based on defects simulations",

keywords = "Conf.proc. > 3 pag",

author = "KRC Mok and RCG Naber and LK Nanver",

year = "2012",

doi = "10.1063/1.4766534",

language = "English",

isbn = "978-0-7354-1108-1",

pages = "245--248",

booktitle = "AIP Conf. Proc. Vol. 1496, 19th International Conference on Ion Implantation Technology (IIT 2012)",

}

Insights to emitter saturation current densities of boron implanted samples based on defects simulations. / Mok, KRC; Naber, RCG; Nanver, LK.
AIP Conf. Proc. Vol. 1496, 19th International Conference on Ion Implantation Technology (IIT 2012). 2012. p. 245-248 (AIP Conference Proceedings; Vol. 1496).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Insights to emitter saturation current densities of boron implanted samples based on defects simulations

AU - Mok, KRC

AU - Naber, RCG

AU - Nanver, LK

PY - 2012

Y1 - 2012

KW - Conf.proc. > 3 pag

U2 - 10.1063/1.4766534

DO - 10.1063/1.4766534

M3 - Conference contribution

SN - 978-0-7354-1108-1

SP - 245

EP - 248

BT - AIP Conf. Proc. Vol. 1496, 19th International Conference on Ion Implantation Technology (IIT 2012)

ER -