Is error detection helpful on IBM 5Q chips?

Christophe Vuillot*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

25 Citations (Scopus)


This paper reports on experiments realized on several IBM 5Q chips which show evidence for the advantage of using error detection and fault-tolerant design of quantum circuits. We show an average improvement of the task of sampling from states that can be fault-tolerantly prepared in the [[4, 2, 2]] code, when using a fault-tolerant technique well suited to the layout of the chip. By showing that fault-tolerant quantum computation is already within our reach, the author hopes to encourage this approach.

Original languageEnglish
Pages (from-to)949-964
Number of pages16
JournalQuantum Information and Computation
Issue number11-12
Publication statusPublished - Sep 2018


  • Error detection
  • Experiment
  • Fault-tolerance
  • Quantum


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