Local discriminant analysis

M Loog, D de Ridder

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

10 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 18th international conference on pattern recognition
Editors	s.n.
Place of Publication	USA
Publisher	IEEE
Pages	1-4
Number of pages	4
ISBN (Print)	0-7695-2521-0
Publication status	Published - 2006
Event	18th International conference on pattern recognition, Hong Kong, China - USA Duration: 20 Aug 2006 → 24 Aug 2006

Name
Publisher	IEEE

Conference	18th International conference on pattern recognition, Hong Kong, China
Period	20/08/06 → 24/08/06

Keywords

@inproceedings{886e53215bfd4b1780a897832455d0e3,

title = "Local discriminant analysis",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "M Loog and {de Ridder}, D",

year = "2006",

language = "Undefined/Unknown",

isbn = "0-7695-2521-0",

publisher = "IEEE",

pages = "1--4",

editor = "s.n.",

booktitle = "Proceedings of the 18th international conference on pattern recognition",

address = "United States",

note = "18th International conference on pattern recognition, Hong Kong, China ; Conference date: 20-08-2006 Through 24-08-2006",

}

TY - GEN

T1 - Local discriminant analysis

AU - Loog, M

AU - de Ridder, D

PY - 2006

Y1 - 2006

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-2521-0

SP - 1

EP - 4

BT - Proceedings of the 18th international conference on pattern recognition

A2 - s.n., null

PB - IEEE

CY - USA

T2 - 18th International conference on pattern recognition, Hong Kong, China

Y2 - 20 August 2006 through 24 August 2006

ER -