Local extraction of base and termal resistance of bipolar transistors

R Setekera, R van der Toorn, W Kloosterman

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings IEEE 2013 Bipolar/BiCMOS Circuit and Technology Meeting
EditorsB Hecht, BYC Lie
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-4
Number of pages4
Publication statusPublished - 2013
Event2013 IEEE BCTM, Bordeaux, France - Piscataway, NJ, USA
Duration: 30 Sep 20133 Oct 2014

Publication series

Name
PublisherIEEE

Conference

Conference2013 IEEE BCTM, Bordeaux, France
Period30/09/133/10/14

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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