Macroscopic X-ray Powder Diffraction Scanning: Possibilities for quantitative and depth-selective parchment analysis

Frederik Vanmeert*, Wout De Nolf, Joris Dik, Koen Janssens

*Corresponding author for this work

    Research output: Contribution to journalArticleScientificpeer-review

    17 Citations (Scopus)

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    Earth and Planetary Sciences

    Engineering