Measurement of the resonant-polaron effect in the reststrahlen band of GaAs:Si using two-photon excitation

PCM Planken, HPM Pellemans, PC van Son, JN Hovenier, TO Klaassen, WT Wenckebach, PW Barmby, JL Dunn, CA Bates, CT Foxon, CJGM Langerak

    Research output: Contribution to journalArticleScientificpeer-review

    2 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)258-262
    Number of pages5
    JournalOptics Communications
    Volume124
    Publication statusPublished - 1996

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