Measuring presence: an overview of assessment methodologies

W.A. Ijsselsteijn, H de Ridder, J. Freeman

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterProfessional

Original languageUndefined/Unknown
Title of host publicationIPO annual progress report 34, 1999
EditorsD.G. Bouwhuis, F.L. van Nes, A.J.M. Houtsma, R.N.J. Veldhuis
Pages37-47
Publication statusPublished - 2000

Keywords

  • ZX Int.klas.verslagjaar < 2002

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