Mechanical integrity failure of bulk-micromachined Si wafers: influence of structure geometry and wafer handling

M Bartek

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    2 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationASDAM 2000 conference proceedings
    Editors J Osvald, T Watanabe
    Place of PublicationPiscataway
    PublisherIEEE Society
    Pages227-230
    Number of pages4
    ISBN (Print)0-7803-5939-9
    Publication statusPublished - 2000
    Event3rd International EuroConference on Advanced Semiconductor Devices and Microsystems, Smolenice, Slovakia - Piscataway
    Duration: 16 Oct 200018 Oct 2000

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference3rd International EuroConference on Advanced Semiconductor Devices and Microsystems, Smolenice, Slovakia
    Period16/10/0018/10/00

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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