@inproceedings{3d2fe1c62cba45479312817f0aed4963,
title = "Mechanical integrity failure of bulk-micromachined Si wafers: influence of structure geometry and wafer handling",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "M Bartek",
year = "2000",
language = "Undefined/Unknown",
isbn = "0-7803-5939-9",
publisher = "IEEE Society",
pages = "227--230",
editor = "{J Osvald} and {T Watanabe}",
booktitle = "ASDAM 2000 conference proceedings",
note = "3rd International EuroConference on Advanced Semiconductor Devices and Microsystems, Smolenice, Slovakia ; Conference date: 16-10-2000 Through 18-10-2000",
}