Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors

F Tamigi; N Nenadovic; V d' Alessandro; LK Nanver; N Rinaldi; JW Slotboom

Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors

F Tamigi, N Nenadovic, V d' Alessandro, LK Nanver, N Rinaldi, JW Slotboom

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings 2004 24th International Conference on Microelectronics (MIEL 2004)
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	257-260
Number of pages	4
ISBN (Print)	0-7803-8166-1
Publication status	Published - 2004
Event	2004 24th International Conference on Microelectronics (MIEL 2004), Nis, Yugoslavia - Piscataway Duration: 16 May 2004 → 19 May 2004

Publication series

Name
Publisher	IEEE

Conference

Conference	2004 24th International Conference on Microelectronics (MIEL 2004), Nis, Yugoslavia
Period	16/05/04 → 19/05/04

Bibliographical note

ed. is niet bekend

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{d1afd5634f5c44569e5b19aa268143f2,

title = "Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "F Tamigi and N Nenadovic and {d' Alessandro}, V and LK Nanver and N Rinaldi and JW Slotboom",

note = "ed. is niet bekend; 2004 24th International Conference on Microelectronics (MIEL 2004), Nis, Yugoslavia ; Conference date: 16-05-2004 Through 19-05-2004",

year = "2004",

language = "Undefined/Unknown",

isbn = "0-7803-8166-1",

publisher = "IEEE Society",

pages = "257--260",

booktitle = "Proceedings 2004 24th International Conference on Microelectronics (MIEL 2004)",

}

Tamigi, F, Nenadovic, N, d' Alessandro, V, Nanver, LK, Rinaldi, N & Slotboom, JW 2004, Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors. in Proceedings 2004 24th International Conference on Microelectronics (MIEL 2004). IEEE Society, Piscataway, pp. 257-260, 2004 24th International Conference on Microelectronics (MIEL 2004), Nis, Yugoslavia, 16/05/04.

Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors. / Tamigi, F; Nenadovic, N; d' Alessandro, V et al.
Proceedings 2004 24th International Conference on Microelectronics (MIEL 2004). Piscataway: IEEE Society, 2004. p. 257-260.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors

AU - Tamigi, F

AU - Nenadovic, N

AU - d' Alessandro, V

AU - Nanver, LK

AU - Rinaldi, N

AU - Slotboom, JW

N1 - ed. is niet bekend

PY - 2004

Y1 - 2004

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7803-8166-1

SP - 257

EP - 260

BT - Proceedings 2004 24th International Conference on Microelectronics (MIEL 2004)

PB - IEEE Society

CY - Piscataway

T2 - 2004 24th International Conference on Microelectronics (MIEL 2004), Nis, Yugoslavia

Y2 - 16 May 2004 through 19 May 2004

ER -