PD inception condition and PD pattern of defects in pilc

Y Muramoto, E Gulski, FJ Wester, JJ Smit

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	ICSD'01: proceedings
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	369-372
Number of pages	4
ISBN (Print)	0-7803-6352-3
Publication status	Published - 2001
Event	2001 IEEE 7th International Conference on Solid Dielectrics, Eindhoven - Piscataway Duration: 25 Jun 2001 → 29 Jun 2001

Name
Publisher	IEEE

Conference	2001 IEEE 7th International Conference on Solid Dielectrics, Eindhoven
Period	25/06/01 → 29/06/01

Keywords

@inproceedings{76b8a195fcbb4058884ea613cdefd0bd,

title = "PD inception condition and PD pattern of defects in pilc",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "Y Muramoto and E Gulski and FJ Wester and JJ Smit",

year = "2001",

language = "Undefined/Unknown",

isbn = "0-7803-6352-3",

publisher = "IEEE Society",

pages = "369--372",

booktitle = "ICSD'01: proceedings",

note = "2001 IEEE 7th International Conference on Solid Dielectrics, Eindhoven ; Conference date: 25-06-2001 Through 29-06-2001",

}

TY - GEN

T1 - PD inception condition and PD pattern of defects in pilc

AU - Muramoto, Y

AU - Gulski, E

AU - Wester, FJ

AU - Smit, JJ

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-6352-3

SP - 369

EP - 372

BT - ICSD'01: proceedings

PB - IEEE Society

CY - Piscataway

T2 - 2001 IEEE 7th International Conference on Solid Dielectrics, Eindhoven

Y2 - 25 June 2001 through 29 June 2001

ER -