Original language | English |
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Pages (from-to) | 115-134 |
Number of pages | 20 |
Journal | Ultramicroscopy |
Volume | 116 |
Publication status | Published - 2012 |
Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy
M Vulovic, EM Franken, RBG Ravelli, LJ van Vliet, B Rieger
Research output: Contribution to journal › Article › Scientific › peer-review
18
Citations
(Scopus)