Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy

M Vulovic, EM Franken, RBG Ravelli, LJ van Vliet, B Rieger

    Research output: Contribution to journalArticleScientificpeer-review

    16 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)115-134
    Number of pages20
    JournalUltramicroscopy
    Volume116
    Publication statusPublished - 2012

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