Prediction of crack growth in IC passivation layers

Y He, MAJ van Gils, WD van Driel, GQ Zhang, RBR van Silfhout, LJ Ernst

Research output: Contribution to journalArticleScientificpeer-review

12 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)2003-2009
Number of pages7
JournalMicroelectronics Reliability
Volume44
Publication statusPublished - 2004

Keywords

  • ZX CWTS JFIS < 1.00

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