Quantitative dilatometric analysis of intercritical annealing in a low-silicon TRIP steel

L Zhao, TA Kop, V Rolin, J Sietsma, AIM Mertens, PJ Jacques, S van der Zwaag

    Research output: Contribution to journalArticleScientificpeer-review

    24 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)1585-1591
    Number of pages7
    JournalJournal of Materials Science
    Volume37
    Publication statusPublished - 2002

    Keywords

    • academic journal papers
    • ZX CWTS JFIS < 1.00

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