Radiation effects on CMOS image sensors due to X-rays

J Tan; B Buttgen; AJP Theuwissen

Radiation effects on CMOS image sensors due to X-rays

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	English
Title of host publication	Proceedings 8th International conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
Editors	J Breza, D Donoval, E Vavrinsky
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	279-283
Number of pages	5
ISBN (Print)	978-1-4244-8575-8
Publication status	Published - 2010
Event	Advanced Semiconductor Devices and Microsystems (ASDAM) 2010 - Piscataway, NJ, USA Duration: 25 Oct 2010 → 27 Oct 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	Advanced Semiconductor Devices and Microsystems (ASDAM) 2010
Period	25/10/10 → 27/10/10

Keywords

conference contrib. non-refer.
Conf.proc. > 3 pag

Cite this

@inproceedings{0e37f672fc8149f98c2d9486b14645b3,

title = "Radiation effects on CMOS image sensors due to X-rays",

keywords = "conference contrib. non-refer., Conf.proc. > 3 pag",

author = "J Tan and B Buttgen and AJP Theuwissen",

year = "2010",

language = "English",

isbn = "978-1-4244-8575-8",

publisher = "IEEE Society",

pages = "279--283",

editor = "J Breza and D Donoval and E Vavrinsky",

booktitle = "Proceedings 8th International conference on Advanced Semiconductor Devices and Microsystems (ASDAM)",

note = "Advanced Semiconductor Devices and Microsystems (ASDAM) 2010 ; Conference date: 25-10-2010 Through 27-10-2010",

}

Radiation effects on CMOS image sensors due to X-rays. / Tan, J; Buttgen, B; Theuwissen, AJP.
Proceedings 8th International conference on Advanced Semiconductor Devices and Microsystems (ASDAM). ed. / J Breza; D Donoval; E Vavrinsky. Piscataway, NJ, USA: IEEE Society, 2010. p. 279-283.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Radiation effects on CMOS image sensors due to X-rays

AU - Tan, J

AU - Buttgen, B

AU - Theuwissen, AJP

PY - 2010

Y1 - 2010

KW - conference contrib. non-refer.

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4244-8575-8

SP - 279

EP - 283

BT - Proceedings 8th International conference on Advanced Semiconductor Devices and Microsystems (ASDAM)

A2 - Breza, J

A2 - Donoval, D

A2 - Vavrinsky, E

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - Advanced Semiconductor Devices and Microsystems (ASDAM) 2010

Y2 - 25 October 2010 through 27 October 2010

ER -