Rapid scanning delay line for optical coherence tomography based on the thermo-optic effect in silicon

E Margallo, G Pandraud, PJ French

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proc. of Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009
Editors	s.n.
Place of Publication	Denver, US
Publisher	IEEE Society
Pages	501-504
Number of pages	4
ISBN (Print)	978-1-4244-4190-7
Publication status	Published - 2009
Event	Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009 - Denver, US Duration: 21 Jun 2009 → 25 Jun 2009

Name
Publisher	IEEE

Conference	Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009
Period	21/06/09 → 25/06/09

Keywords

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title = "Rapid scanning delay line for optical coherence tomography based on the thermo-optic effect in silicon",

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author = "E Margallo and G Pandraud and PJ French",

year = "2009",

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isbn = "978-1-4244-4190-7",

publisher = "IEEE Society",

pages = "501--504",

editor = "s.n.",

booktitle = "Proc. of Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009",

note = "Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009 ; Conference date: 21-06-2009 Through 25-06-2009",

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Margallo, E, Pandraud, G & French, PJ 2009, Rapid scanning delay line for optical coherence tomography based on the thermo-optic effect in silicon. in s.n. (ed.), Proc. of Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. IEEE Society, Denver, US, pp. 501-504, Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009, 21/06/09.

Rapid scanning delay line for optical coherence tomography based on the thermo-optic effect in silicon. / Margallo, E; Pandraud, G; French, PJ.
Proc. of Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. ed. / s.n. Denver, US: IEEE Society, 2009. p. 501-504.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Rapid scanning delay line for optical coherence tomography based on the thermo-optic effect in silicon

AU - Margallo, E

AU - Pandraud, G

AU - French, PJ

PY - 2009

Y1 - 2009

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4244-4190-7

SP - 501

EP - 504

BT - Proc. of Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009

A2 - s.n., null

PB - IEEE Society

CY - Denver, US

T2 - Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009

Y2 - 21 June 2009 through 25 June 2009

ER -