Reliability polynomials crossing more than twice

JL Brown; Y Koc; RE Kooij

Reliability polynomials crossing more than twice

JL Brown, Y Koc, RE Kooij

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	3rd international congress on ultra modern telecommunications and control systems and workshops (ICUMT)
Editors	s.n.
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	1-6
Number of pages	6
ISBN (Print)	978-1-457-0682-0
Publication status	Published - 2011
Event	3rd ICUMT 2011 - Piscataway, NJ, USA Duration: 5 Oct 2011 → 7 Oct 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	3rd ICUMT 2011
Period	5/10/11 → 7/10/11

Cite this

@inproceedings{9c19dfd981f2420497e26ad6b310ec36,

title = "Reliability polynomials crossing more than twice",

author = "JL Brown and Y Koc and RE Kooij",

year = "2011",

language = "English",

isbn = "978-1-457-0682-0",

publisher = "IEEE Society",

pages = "1--6",

editor = "s.n.",

booktitle = "3rd international congress on ultra modern telecommunications and control systems and workshops (ICUMT)",

note = "3rd ICUMT 2011 ; Conference date: 05-10-2011 Through 07-10-2011",

}

Reliability polynomials crossing more than twice. / Brown, JL; Koc, Y; Kooij, RE.
3rd international congress on ultra modern telecommunications and control systems and workshops (ICUMT). ed. / s.n. Piscataway, NJ, USA: IEEE Society, 2011. p. 1-6.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Reliability polynomials crossing more than twice

AU - Brown, JL

AU - Koc, Y

AU - Kooij, RE

PY - 2011

Y1 - 2011

UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6078860

M3 - Conference contribution

SN - 978-1-457-0682-0

SP - 1

EP - 6

BT - 3rd international congress on ultra modern telecommunications and control systems and workshops (ICUMT)

A2 - s.n., null

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - 3rd ICUMT 2011

Y2 - 5 October 2011 through 7 October 2011

ER -

Reliability polynomials crossing more than twice

Publication series

Conference

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Cite this