RF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussions

V Milovanovic, R van der Toorn, R Pijper

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	560-565
Number of pages	6
Journal	Microelectronics Reliability
Volume	51
Issue number	3
Publication status	Published - 2011

Keywords

@article{1681dd6d7b734ec98b5307ddbcfe4fee,

title = "RF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussions",

keywords = "academic journal papers, CWTS JFIS < 0.75",

author = "V Milovanovic and {van der Toorn}, R and R Pijper",

year = "2011",

language = "English",

volume = "51",

pages = "560--565",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

number = "3",

}

TY - JOUR

T1 - RF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussions

AU - Milovanovic, V

AU - van der Toorn, R

AU - Pijper, R

PY - 2011

Y1 - 2011

KW - academic journal papers

KW - CWTS JFIS < 0.75

M3 - Article

SN - 0026-2714

VL - 51

SP - 560

EP - 565

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 3

ER -