Robustness of attractors in tapping mode atomic force microscopy

Abhilash Chandrashekar, Pierpaolo Belardinelli, Urs Staufer, Farbod Alijani*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

22 Citations (Scopus)
131 Downloads (Pure)


In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode atomic force microscopy. The numerical model is based on cantilever dynamics driven in the Lennard–Jones potential. Pseudo-arc-length continuation and basins of attraction are utilized to obtain the frequency response and dynamical integrity of the attractors. The global bifurcation and response scenario maps for the system are developed by incorporating several local bifurcation loci in the excitation parameter space. Moreover, the map delineates various escape thresholds for different attractors present in the system. Our work unveils the properties of the cantilever oscillation in proximity to the sample surface, which is governed by the so-called in-contact attractor. The robustness of this attractor against operating parameters is quantified by means of integrity profiles. Our work provides a unique view into global dynamics in tapping mode atomic force microscopy and helps establishing an extended topological view of the system.

Original languageEnglish
Pages (from-to)1137-1158
JournalNonlinear Dynamics
Issue number2
Publication statusPublished - 2019


  • Atomic force microscopy
  • Basin erosion
  • Basins of attraction
  • Bifurcation chart
  • Dynamical integrity
  • In-contact attractor
  • Integrity profiles
  • Robustness
  • Tapping mode


Dive into the research topics of 'Robustness of attractors in tapping mode atomic force microscopy'. Together they form a unique fingerprint.
  • Nonlinear dynamic atomic force microscopy

    Chandrashekar, A., 28 Sept 2022, 161 p.

    Research output: ThesisDissertation (TU Delft)

    Open Access
    8 Downloads (Pure)

Cite this