TY - JOUR
T1 - Robustness of attractors in tapping mode atomic force microscopy
AU - Chandrashekar, Abhilash
AU - Belardinelli, Pierpaolo
AU - Staufer, Urs
AU - Alijani, Farbod
PY - 2019
Y1 - 2019
N2 - In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode atomic force microscopy. The numerical model is based on cantilever dynamics driven in the Lennard–Jones potential. Pseudo-arc-length continuation and basins of attraction are utilized to obtain the frequency response and dynamical integrity of the attractors. The global bifurcation and response scenario maps for the system are developed by incorporating several local bifurcation loci in the excitation parameter space. Moreover, the map delineates various escape thresholds for different attractors present in the system. Our work unveils the properties of the cantilever oscillation in proximity to the sample surface, which is governed by the so-called in-contact attractor. The robustness of this attractor against operating parameters is quantified by means of integrity profiles. Our work provides a unique view into global dynamics in tapping mode atomic force microscopy and helps establishing an extended topological view of the system.
AB - In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode atomic force microscopy. The numerical model is based on cantilever dynamics driven in the Lennard–Jones potential. Pseudo-arc-length continuation and basins of attraction are utilized to obtain the frequency response and dynamical integrity of the attractors. The global bifurcation and response scenario maps for the system are developed by incorporating several local bifurcation loci in the excitation parameter space. Moreover, the map delineates various escape thresholds for different attractors present in the system. Our work unveils the properties of the cantilever oscillation in proximity to the sample surface, which is governed by the so-called in-contact attractor. The robustness of this attractor against operating parameters is quantified by means of integrity profiles. Our work provides a unique view into global dynamics in tapping mode atomic force microscopy and helps establishing an extended topological view of the system.
KW - Atomic force microscopy
KW - Basin erosion
KW - Basins of attraction
KW - Bifurcation chart
KW - Dynamical integrity
KW - In-contact attractor
KW - Integrity profiles
KW - Robustness
KW - Tapping mode
UR - http://www.scopus.com/inward/record.url?scp=85068015760&partnerID=8YFLogxK
U2 - 10.1007/s11071-019-05037-y
DO - 10.1007/s11071-019-05037-y
M3 - Article
AN - SCOPUS:85068015760
VL - 97
SP - 1137
EP - 1158
JO - Nonlinear Dynamics: an international journal of nonlinear dynamics and chaos in engineering systems
JF - Nonlinear Dynamics: an international journal of nonlinear dynamics and chaos in engineering systems
SN - 0924-090X
IS - 2
ER -