Scanning tunneling microscopy of cobalt on silicon surfaces.

B Ilge

    Research output: ThesisDissertation (TU Delft)

    Original languageUndefined/Unknown
    QualificationDoctor of Philosophy
    Awarding Institution
    • Delft University of Technology
    • Mooij, J.E., Supervisor
    • Geerligs, LJ, Advisor, External person
    Award date4 Dec 2000
    Place of PublicationDelft
    Print ISBNs90-73235-61-8
    Publication statusPublished - 2000


    • other publications
    • ZX Int.klas.verslagjaar < 2002

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