Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold

W. I.L. Lawrie, M. Rimbach-Russ, F. van Riggelen, N. W. Hendrickx, S. L.de Snoo, A. Sammak, G. Scappucci, J. Helsen, M. Veldhorst*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

11 Citations (Scopus)
32 Downloads (Pure)

Abstract

Practical Quantum computing hinges on the ability to control large numbers of qubits with high fidelity. Quantum dots define a promising platform due to their compatibility with semiconductor manufacturing. Moreover, high-fidelity operations above 99.9% have been realized with individual qubits, though their performance has been limited to 98.67% when driving two qubits simultaneously. Here we present single-qubit randomized benchmarking in a two-dimensional array of spin qubits, finding native gate fidelities as high as 99.992(1)%. Furthermore, we benchmark single qubit gate performance while simultaneously driving two and four qubits, utilizing a novel benchmarking technique called N-copy randomized benchmarking, designed for simple experimental implementation and accurate simultaneous gate fidelity estimation. We find two- and four-copy randomized benchmarking fidelities of 99.905(8)% and 99.34(4)% respectively, and that next-nearest neighbor pairs are highly robust to cross-talk errors. These characterizations of single-qubit gate quality are crucial for scaling up quantum information technology.

Original languageEnglish
Article number3617
Number of pages7
JournalNature Communications
Volume14
Issue number1
DOIs
Publication statusPublished - 2023

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