Size effects on the bending stiffness of silicon nanocantilevers

H Sadeghian Marnani; CK Yang; JFL Goosen; A Bossche; PJ French; F van Keulen

Size effects on the bending stiffness of silicon nanocantilevers

H Sadeghian Marnani, CK Yang, JFL Goosen, A Bossche, PJ French, F van Keulen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Abstract

The elastic behavior of silicon nanocantilevers and nanowires, and specifically the effective Young's modulus has been shown by previous experimental measurements and theoretical investigations to be size-dependent.

Original language	Undefined/Unknown
Title of host publication	Proceedings of ProRISC 2009, 20th Annual Workshop on circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, November 26-27, 2009, Veldhoven, The Netherlands
Editors	s.n.
Place of Publication	Veldhoven, The Netherlands
Publisher	ProRISC en SAFE
Pages	108-111
Number of pages	4
ISBN (Print)	978-90-73461-62-8
Publication status	Published - 2009
Event	ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, Veldhoven, The Netherlands - Veldhoven, The Netherlands Duration: 26 Nov 2009 → 27 Nov 2009

Publication series

Name
Publisher	ProRISC en SAFE

Conference

Conference	ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, Veldhoven, The Netherlands
Period	26/11/09 → 27/11/09

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

Sadeghian Marnani, H., Yang, CK., Goosen, JFL., Bossche, A., French, PJ., & van Keulen, F. (2009). Size effects on the bending stiffness of silicon nanocantilevers. In s.n. (Ed.), Proceedings of ProRISC 2009, 20th Annual Workshop on circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, November 26-27, 2009, Veldhoven, The Netherlands (pp. 108-111). ProRISC en SAFE.

Sadeghian Marnani, H ; Yang, CK ; Goosen, JFL et al. / Size effects on the bending stiffness of silicon nanocantilevers. Proceedings of ProRISC 2009, 20th Annual Workshop on circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, November 26-27, 2009, Veldhoven, The Netherlands. editor / s.n. Veldhoven, The Netherlands : ProRISC en SAFE, 2009. pp. 108-111

@inproceedings{3f74ca0126174448a6141a8a7bb60b8f,

title = "Size effects on the bending stiffness of silicon nanocantilevers",

abstract = "The elastic behavior of silicon nanocantilevers and nanowires, and specifically the effective Young's modulus has been shown by previous experimental measurements and theoretical investigations to be size-dependent.",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "{Sadeghian Marnani}, H and CK Yang and JFL Goosen and A Bossche and PJ French and {van Keulen}, F",

year = "2009",

language = "Undefined/Unknown",

isbn = "978-90-73461-62-8",

publisher = "ProRISC en SAFE",

pages = "108--111",

editor = "s.n.",

booktitle = "Proceedings of ProRISC 2009, 20th Annual Workshop on circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, November 26-27, 2009, Veldhoven, The Netherlands",

note = "ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, Veldhoven, The Netherlands ; Conference date: 26-11-2009 Through 27-11-2009",

}

Sadeghian Marnani, H, Yang, CK , Goosen, JFL , Bossche, A , French, PJ & van Keulen, F 2009, Size effects on the bending stiffness of silicon nanocantilevers. in s.n. (ed.), Proceedings of ProRISC 2009, 20th Annual Workshop on circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, November 26-27, 2009, Veldhoven, The Netherlands. ProRISC en SAFE, Veldhoven, The Netherlands, pp. 108-111, ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, Veldhoven, The Netherlands, 26/11/09.

Size effects on the bending stiffness of silicon nanocantilevers. / Sadeghian Marnani, H; Yang, CK ; Goosen, JFL et al.
Proceedings of ProRISC 2009, 20th Annual Workshop on circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, November 26-27, 2009, Veldhoven, The Netherlands. ed. / s.n. Veldhoven, The Netherlands: ProRISC en SAFE, 2009. p. 108-111.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Size effects on the bending stiffness of silicon nanocantilevers

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AU - Yang, CK

AU - Goosen, JFL

AU - Bossche, A

AU - French, PJ

AU - van Keulen, F

PY - 2009

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N2 - The elastic behavior of silicon nanocantilevers and nanowires, and specifically the effective Young's modulus has been shown by previous experimental measurements and theoretical investigations to be size-dependent.

AB - The elastic behavior of silicon nanocantilevers and nanowires, and specifically the effective Young's modulus has been shown by previous experimental measurements and theoretical investigations to be size-dependent.

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-90-73461-62-8

SP - 108

EP - 111

BT - Proceedings of ProRISC 2009, 20th Annual Workshop on circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, November 26-27, 2009, Veldhoven, The Netherlands

A2 - s.n., null

PB - ProRISC en SAFE

CY - Veldhoven, The Netherlands

T2 - ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, Veldhoven, The Netherlands

Y2 - 26 November 2009 through 27 November 2009

ER -

Sadeghian Marnani H, Yang CK , Goosen JFL , Bossche A , French PJ , van Keulen F. Size effects on the bending stiffness of silicon nanocantilevers. In s.n., editor, Proceedings of ProRISC 2009, 20th Annual Workshop on circuits, Systems and Signal Processing, SAFE 2009, 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, November 26-27, 2009, Veldhoven, The Netherlands. Veldhoven, The Netherlands: ProRISC en SAFE. 2009. p. 108-111