Spur-free multirate all-digital PLL for mobile phones in 65nm CMOS

RB Staszewski, K Waheed, F Dulger, O Eliezer

Research output: Contribution to journal › Article › Scientific › peer-review

60 Citations (Scopus)

Original language	English
Pages (from-to)	2904-2919
Number of pages	16
Journal	IEEE Journal of Solid State Circuits
Volume	46
Issue number	12
DOIs	https://doi.org/10.1109/JSSC.2011.2162769
Publication status	Published - 2011

Keywords

@article{531d22a88b52424583eaaf620f2b3c14,

title = "Spur-free multirate all-digital PLL for mobile phones in 65nm CMOS",

keywords = "CWTS JFIS >= 2.00",

author = "RB Staszewski and K Waheed and F Dulger and O Eliezer",

year = "2011",

doi = "10.1109/JSSC.2011.2162769",

language = "English",

volume = "46",

pages = "2904--2919",

journal = "IEEE Journal of Solid State Circuits",

issn = "0018-9200",

publisher = "IEEE",

number = "12",

}

TY - JOUR

T1 - Spur-free multirate all-digital PLL for mobile phones in 65nm CMOS

AU - Staszewski, RB

AU - Waheed, K

AU - Dulger, F

AU - Eliezer, O

PY - 2011

Y1 - 2011

KW - CWTS JFIS >= 2.00

U2 - 10.1109/JSSC.2011.2162769

DO - 10.1109/JSSC.2011.2162769

M3 - Article

SN - 0018-9200

VL - 46

SP - 2904

EP - 2919

JO - IEEE Journal of Solid State Circuits

JF - IEEE Journal of Solid State Circuits

IS - 12

ER -