Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications

V Mohammadi; L Shi; U Kroth; C Laubis; S Nihtianov

doi:10.1109/ICIT.2015.7125599

Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications

V Mohammadi, L Shi, U Kroth, C Laubis, S Nihtianov

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

6 Citations (Scopus)

Original language	English
Title of host publication	Proceedings - 2015 IEEE International Conference on Industrial Technology
Editors	LG Franquelo, BM Wilamowski
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	3370-3376
Number of pages	7
ISBN (Print)	978-1-4799-7800-7
DOIs	https://doi.org/10.1109/ICIT.2015.7125599
Publication status	Published - 2015
Event	ICIT 2015, Seville, Spain - Piscataway, NJ, USA Duration: 17 Mar 2015 → 19 Mar 2015

Publication series

Name
Publisher	IEEE

Conference

Conference	ICIT 2015, Seville, Spain
Period	17/03/15 → 19/03/15

Bibliographical note

Harvest

Access to Document

10.1109/ICIT.2015.7125599

Cite this

Mohammadi, V., Shi, L., Kroth, U., Laubis, C., & Nihtianov, S. (2015). Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications. In LG. Franquelo, & BM. Wilamowski (Eds.), Proceedings - 2015 IEEE International Conference on Industrial Technology (pp. 3370-3376). IEEE Society. https://doi.org/10.1109/ICIT.2015.7125599

@inproceedings{ec23807428884aacac7162a523971816,

title = "Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications",

author = "V Mohammadi and L Shi and U Kroth and C Laubis and S Nihtianov",

note = "Harvest; ICIT 2015, Seville, Spain ; Conference date: 17-03-2015 Through 19-03-2015",

year = "2015",

doi = "10.1109/ICIT.2015.7125599",

language = "English",

isbn = "978-1-4799-7800-7",

publisher = "IEEE Society",

pages = "3370--3376",

editor = "LG Franquelo and BM Wilamowski",

booktitle = "Proceedings - 2015 IEEE International Conference on Industrial Technology",

}

Mohammadi, V, Shi, L, Kroth, U, Laubis, C & Nihtianov, S 2015, Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications. in LG Franquelo & BM Wilamowski (eds), Proceedings - 2015 IEEE International Conference on Industrial Technology. IEEE Society, Piscataway, NJ, USA, pp. 3370-3376, ICIT 2015, Seville, Spain, 17/03/15. https://doi.org/10.1109/ICIT.2015.7125599

Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications. / Mohammadi, V; Shi, L; Kroth, U et al.
Proceedings - 2015 IEEE International Conference on Industrial Technology. ed. / LG Franquelo; BM Wilamowski. Piscataway, NJ, USA: IEEE Society, 2015. p. 3370-3376.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications

AU - Mohammadi, V

AU - Shi, L

AU - Kroth, U

AU - Laubis, C

AU - Nihtianov, S

N1 - Harvest

PY - 2015

Y1 - 2015

U2 - 10.1109/ICIT.2015.7125599

DO - 10.1109/ICIT.2015.7125599

M3 - Conference contribution

SN - 978-1-4799-7800-7

SP - 3370

EP - 3376

BT - Proceedings - 2015 IEEE International Conference on Industrial Technology

A2 - Franquelo, LG

A2 - Wilamowski, BM

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - ICIT 2015, Seville, Spain

Y2 - 17 March 2015 through 19 March 2015

ER -

Mohammadi V, Shi L, Kroth U, Laubis C, Nihtianov S. Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications. In Franquelo LG, Wilamowski BM, editors, Proceedings - 2015 IEEE International Conference on Industrial Technology. Piscataway, NJ, USA: IEEE Society. 2015. p. 3370-3376 doi: 10.1109/ICIT.2015.7125599