Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications

V Mohammadi, L Shi, U Kroth, C Laubis, S Nihtianov

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings - 2015 IEEE International Conference on Industrial Technology
EditorsLG Franquelo, BM Wilamowski
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages3370-3376
Number of pages7
ISBN (Print)978-1-4799-7800-7
DOIs
Publication statusPublished - 2015
EventICIT 2015, Seville, Spain - Piscataway, NJ, USA
Duration: 17 Mar 201519 Mar 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceICIT 2015, Seville, Spain
Period17/03/1519/03/15

Cite this

Mohammadi, V., Shi, L., Kroth, U., Laubis, C., & Nihtianov, S. (2015). Stability characterization of high-performance PureB Si-photodiodes under aggressive cleaning treatments in industrial applications. In LG. Franquelo, & BM. Wilamowski (Eds.), Proceedings - 2015 IEEE International Conference on Industrial Technology (pp. 3370-3376). IEEE Society. https://doi.org/10.1109/ICIT.2015.7125599