Statistical pattern recognition approach to edge detection in multichannel images

S Verzakov; P Paclik; RPW Duin

Statistical pattern recognition approach to edge detection in multichannel images

S Verzakov, P Paclik, RPW Duin

Multimedia Computing

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the twelfth annual conference of the Advanced School for Computing and Imaging
Editors	JWJ Heijnsdijk, BPF Lelieveldt, B Haverkort, CTAM de Laat
Place of Publication	Delft
Publisher	ASCI
Pages	434-439
Number of pages	6
ISBN (Print)	90-810849-1-7
Publication status	Published - 2006
Event	The twelfth annual conference of the Advance School for Computing and Imaging, Lommel, Belgium - Delft Duration: 14 Jun 2006 → 16 Jun 2006

Publication series

Name
Publisher	ASCI

Conference

Conference	The twelfth annual conference of the Advance School for Computing and Imaging, Lommel, Belgium
Period	14/06/06 → 16/06/06

Keywords

conference contrib. refereed
Vakpubl., Overig wet. > 3 pag

Cite this

@inproceedings{7ee39638e20041209e8c1bf1478c949e,

title = "Statistical pattern recognition approach to edge detection in multichannel images",

keywords = "conference contrib. refereed, Vakpubl., Overig wet. > 3 pag",

author = "S Verzakov and P Paclik and RPW Duin",

year = "2006",

language = "Undefined/Unknown",

isbn = "90-810849-1-7",

publisher = "ASCI",

pages = "434--439",

editor = "JWJ Heijnsdijk and BPF Lelieveldt and B Haverkort and {de Laat}, CTAM",

booktitle = "Proceedings of the twelfth annual conference of the Advanced School for Computing and Imaging",

note = "The twelfth annual conference of the Advance School for Computing and Imaging, Lommel, Belgium ; Conference date: 14-06-2006 Through 16-06-2006",

}

Verzakov, S, Paclik, P & Duin, RPW 2006, Statistical pattern recognition approach to edge detection in multichannel images. in JWJ Heijnsdijk, BPF Lelieveldt, B Haverkort & CTAM de Laat (eds), Proceedings of the twelfth annual conference of the Advanced School for Computing and Imaging. ASCI, Delft, pp. 434-439, The twelfth annual conference of the Advance School for Computing and Imaging, Lommel, Belgium, 14/06/06.

Statistical pattern recognition approach to edge detection in multichannel images. / Verzakov, S; Paclik, P; Duin, RPW.
Proceedings of the twelfth annual conference of the Advanced School for Computing and Imaging. ed. / JWJ Heijnsdijk; BPF Lelieveldt; B Haverkort; CTAM de Laat. Delft: ASCI, 2006. p. 434-439.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Statistical pattern recognition approach to edge detection in multichannel images

AU - Verzakov, S

AU - Paclik, P

AU - Duin, RPW

PY - 2006

Y1 - 2006

KW - conference contrib. refereed

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SN - 90-810849-1-7

SP - 434

EP - 439

BT - Proceedings of the twelfth annual conference of the Advanced School for Computing and Imaging

A2 - Heijnsdijk, JWJ

A2 - Lelieveldt, BPF

A2 - Haverkort, B

A2 - de Laat, CTAM

PB - ASCI

CY - Delft

T2 - The twelfth annual conference of the Advance School for Computing and Imaging, Lommel, Belgium

Y2 - 14 June 2006 through 16 June 2006

ER -