Study, modelling and charactirization of silicon surface, interface and bulk effects on the response of a CMOS image sensor in 0.18-micrometer technology

P Ramachandra Rao; AJP Theuwissen

Study, modelling and charactirization of silicon surface, interface and bulk effects on the response of a CMOS image sensor in 0.18-micrometer technology

Electronic Instrumentation

Research output: Book/Report › Report › Professional

Original language	Undefined/Unknown
Place of Publication	Utrecht
Publisher	Technologiestichting STW
Number of pages	7
Volume	STW-project 5869
Publication status	Published - 2004

Publication series

Name
Publisher	Technologiestichting STW

Bibliographical note

nog niet eeder opgevoerd JH

Keywords

other publications
Geen BTA classificatie

Cite this

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title = "Study, modelling and charactirization of silicon surface, interface and bulk effects on the response of a CMOS image sensor in 0.18-micrometer technology",

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author = "{Ramachandra Rao}, P and AJP Theuwissen",

note = "nog niet eeder opgevoerd JH",

year = "2004",

language = "Undefined/Unknown",

volume = "STW-project 5869",

publisher = "Technologiestichting STW",

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TY - BOOK

T1 - Study, modelling and charactirization of silicon surface, interface and bulk effects on the response of a CMOS image sensor in 0.18-micrometer technology

AU - Ramachandra Rao, P

AU - Theuwissen, AJP

N1 - nog niet eeder opgevoerd JH

PY - 2004

Y1 - 2004

KW - other publications

KW - Geen BTA classificatie

M3 - Report

VL - STW-project 5869

BT - Study, modelling and charactirization of silicon surface, interface and bulk effects on the response of a CMOS image sensor in 0.18-micrometer technology

PB - Technologiestichting STW

CY - Utrecht

ER -