Study, modelling and charactirization of silicon surface, interface and bulk effects on the response of a CMOS image sensor in 0.18-micrometer technology

Research output: Book/ReportReportProfessional

Original languageUndefined/Unknown
Place of PublicationUtrecht
PublisherTechnologiestichting STW
Number of pages7
VolumeSTW-project 5869
Publication statusPublished - 2004

Publication series

PublisherTechnologiestichting STW

Bibliographical note

nog niet eeder opgevoerd JH


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