Study of Si/SiO-2 interface using positrons: present status and prospects

JMM de Nijs, M Clement

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationFundamental Aspects of Ultrathin Dielectrics on Si-based Devices
Editors E Garfunkel, E Gusev, A Vul
PublisherKluwer Academic Publishers
ISBN (Print)0-7923-5007
Publication statusPublished - 1998


  • ZX Int.klas.verslagjaar < 2002

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