Study of Si/SiO-2 interface using positrons: present status and prospects

JMM de Nijs, M Clement

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices
Editors	E Garfunkel, E Gusev, A Vul
Publisher	Kluwer Academic Publishers
Pages	25-38
ISBN (Print)	0-7923-5007
Publication status	Published - 1998

Keywords

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title = "Study of Si/SiO-2 interface using positrons: present status and prospects",

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T1 - Study of Si/SiO-2 interface using positrons: present status and prospects

AU - de Nijs, JMM

AU - Clement, M

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Y1 - 1998

KW - ZX Int.klas.verslagjaar < 2002

M3 - Chapter

SN - 0-7923-5007

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BT - Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices

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A2 - E Gusev, null

A2 - A Vul, null

PB - Kluwer Academic Publishers

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