Superconducting Integrated Circuits at Sub-millimeter Wavelengths

Research output: ThesisDissertation (TU Delft)

Abstract

Superconducting integrated circuits (SICs) represent a natural step forward for devices operating at frequencies from microwave up to sub-millimeter wavelengths. They offer massive miniaturization via compact design based on low-loss superconducting transmission lines. At sub-millimeter wavelengths, the development of SICs is driven by astronomical instruments where it could allow the realization of an imaging spectrometer, combining simultaneous imaging and spectroscopy capabilities into a single instrument analogous to integral field units in the infrared and optical regimes. Such an imaging spectrometer can be achieved with SICs by integrating the required elements, such as spectral filters and polarizers, with the detectors onto a single chip. Without this integration, the dispersive system for even a single spatial pixel at these wavelengths would be prohibitively large and could not be realistically scaled up to allow imaging. Astronomical signals are exceedingly weak, typically requiring many nights of exposure to get a good signal to noise ratio. It is therefore imperative that the instrument has minimal losses before its detectors. As a consequence, the losses of each element in the SIC needs to be minimized, which requires careful characterization of the individual elements, including antenna, filters, detectors and connecting transmission lines. The primary focus of this thesis lies on the experimental characterization of the wideband antenna and the low-loss superconducting transmission lines. All experiments in this thesis are based on a
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Baselmans, J.J.A., Supervisor
  • Endo, A., Advisor
Award date15 Nov 2021
Print ISBNs978-94-6421-528-1
DOIs
Publication statusPublished - 2021

Keywords

  • Sub-millimeter systems
  • Transmission Lines
  • Dielectric Loss
  • Radiation Loss
  • Sub-millimeter Loss
  • Fabry–Pérot
  • Low-temperature Detectors

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