Original language | English |
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Pages (from-to) | 2888-2894 |
Number of pages | 7 |
Journal | IEEE Transactions on Electron Devices |
Volume | 59 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2012 |
Surface-charge-collection-enhanced high-sensitivity high-stability silicon photodiodes for DUV and VUV spectral ranges
L Shi, S Nihtianov, L Haspeslagh, F Scholze, A Gottwald, LK Nanver
Research output: Contribution to journal › Article › Scientific › peer-review
25
Citations
(Scopus)