Surface contamination induced resonance frequency shift of cantilevers

H Sadeghian; CK Yang; K Babaei Gavan; JFL Goosen; EWJM van der Drift; HSJ van der Zant; PJ French; A Bossche; F van Keulen

doi:http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604

Surface contamination induced resonance frequency shift of cantilevers

H Sadeghian, CK Yang, K Babaei Gavan, JFL Goosen, EWJM van der Drift, HSJ van der Zant, PJ French, A Bossche, F van Keulen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings 2009, 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems
Editors	s.n.
Place of Publication	Tokyo, Japan
Publisher	IEEE
Pages	396-399
Number of pages	4
ISBN (Print)	978-1-4244-4629-2
DOIs	https://doi.org/http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604
Publication status	Published - 2009
Event	2009 4th IEEE - NEMS, Shenzhen, China - Tokyo, Japan Duration: 5 Jan 2009 → 8 Jan 2009

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	2009 4th IEEE - NEMS, Shenzhen, China
Period	5/01/09 → 8/01/09

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Access to Document

http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604

Cite this

Sadeghian, H., Yang, CK., Babaei Gavan, K., Goosen, JFL., van der Drift, EWJM., van der Zant, HSJ., French, PJ., Bossche, A., & van Keulen, F. (2009). Surface contamination induced resonance frequency shift of cantilevers. In s.n. (Ed.), Proceedings 2009, 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (pp. 396-399). IEEE. https://doi.org/http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604

@inproceedings{93d9c36fd28b4396a8a795df30dbfa7f,

title = "Surface contamination induced resonance frequency shift of cantilevers",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "H Sadeghian and CK Yang and {Babaei Gavan}, K and JFL Goosen and {van der Drift}, EWJM and {van der Zant}, HSJ and PJ French and A Bossche and {van Keulen}, F",

year = "2009",

doi = "http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604",

language = "Undefined/Unknown",

isbn = "978-1-4244-4629-2",

publisher = "IEEE",

pages = "396--399",

editor = "s.n.",

booktitle = "Proceedings 2009, 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems",

address = "United States",

note = "2009 4th IEEE - NEMS, Shenzhen, China ; Conference date: 05-01-2009 Through 08-01-2009",

}

Sadeghian, H, Yang, CK, Babaei Gavan, K, Goosen, JFL , van der Drift, EWJM , van der Zant, HSJ , French, PJ , Bossche, A & van Keulen, F 2009, Surface contamination induced resonance frequency shift of cantilevers. in s.n. (ed.), Proceedings 2009, 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems. IEEE, Tokyo, Japan, pp. 396-399, 2009 4th IEEE - NEMS, Shenzhen, China, 5/01/09. https://doi.org/http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604

Surface contamination induced resonance frequency shift of cantilevers. / Sadeghian, H; Yang, CK; Babaei Gavan, K et al.
Proceedings 2009, 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems. ed. / s.n. Tokyo, Japan: IEEE, 2009. p. 396-399.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Surface contamination induced resonance frequency shift of cantilevers

AU - Sadeghian, H

AU - Yang, CK

AU - Babaei Gavan, K

AU - Goosen, JFL

AU - van der Drift, EWJM

AU - van der Zant, HSJ

AU - French, PJ

AU - Bossche, A

AU - van Keulen, F

PY - 2009

Y1 - 2009

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604

DO - http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604

M3 - Conference contribution

SN - 978-1-4244-4629-2

SP - 396

EP - 399

BT - Proceedings 2009, 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems

A2 - s.n., null

PB - IEEE

CY - Tokyo, Japan

T2 - 2009 4th IEEE - NEMS, Shenzhen, China

Y2 - 5 January 2009 through 8 January 2009

ER -

Sadeghian H, Yang CK, Babaei Gavan K, Goosen JFL , van der Drift EWJM , van der Zant HSJ et al. Surface contamination induced resonance frequency shift of cantilevers. In s.n., editor, Proceedings 2009, 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems. Tokyo, Japan: IEEE. 2009. p. 396-399 doi: http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604