Test procedure and test circuit considerations for on load tap changer dynamics resistance measurement

JJ Erbrink; E Gulski; JJ Smit; J Aditya; LA Chmura; R Leich; PP Seitz; B Quak

doi:doi:10.1109/ICHVE.2010.5640762

Test procedure and test circuit considerations for on load tap changer dynamics resistance measurement

JJ Erbrink, E Gulski, JJ Smit, J Aditya, LA Chmura, R Leich, PP Seitz, B Quak

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Abstract

Resistance measurements on power transformers are offline diagnostic methods that are performed without opening the transformer main tank. In case the power transformer is equipped with an on-load tap changer (OLTC), this resistance measurement can be used to find degradation and defects inside the OLTC. Many OLTC defects as well as contact degradation can be measured by means of dynamic resistance measurements, which is a resistance test during OLTC operation. A low (DC) test current through the on-load tap changer is used during dynamic resistance measurements. This method is in particular sensitive to maintenance errors, contact degradation and contact timing problems. In general, distinction can be made between defects that interrupt the current through the OLTC, defects that affect the timing of the OLTC contacts and contact degradation resulting in abnormal contact resistance.

Original language	Undefined/Unknown
Title of host publication	2010 International conference on high voltage engineering and application (ICHVE)
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	317-320
Number of pages	4
ISBN (Print)	978-1-4244-8283-2
DOIs	https://doi.org/doi:10.1109/ICHVE.2010.5640762
Publication status	Published - 2010
Event	2010 International conference on high voltage engineering and application (ICHVE), New Orleans - Piscataway Duration: 11 Oct 2010 → 14 Oct 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	2010 International conference on high voltage engineering and application (ICHVE), New Orleans
Period	11/10/10 → 14/10/10

Keywords

Conf.proc. > 3 pag

Access to Document

doi:10.1109/ICHVE.2010.5640762

Cite this

Erbrink, JJ., Gulski, E., Smit, JJ., Aditya, J., Chmura, LA., Leich, R., Seitz, PP., & Quak, B. (2010). Test procedure and test circuit considerations for on load tap changer dynamics resistance measurement. In s.n. (Ed.), 2010 International conference on high voltage engineering and application (ICHVE) (pp. 317-320). IEEE Society. https://doi.org/doi:10.1109/ICHVE.2010.5640762

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title = "Test procedure and test circuit considerations for on load tap changer dynamics resistance measurement",

abstract = "Resistance measurements on power transformers are offline diagnostic methods that are performed without opening the transformer main tank. In case the power transformer is equipped with an on-load tap changer (OLTC), this resistance measurement can be used to find degradation and defects inside the OLTC. Many OLTC defects as well as contact degradation can be measured by means of dynamic resistance measurements, which is a resistance test during OLTC operation. A low (DC) test current through the on-load tap changer is used during dynamic resistance measurements. This method is in particular sensitive to maintenance errors, contact degradation and contact timing problems. In general, distinction can be made between defects that interrupt the current through the OLTC, defects that affect the timing of the OLTC contacts and contact degradation resulting in abnormal contact resistance.",

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author = "JJ Erbrink and E Gulski and JJ Smit and J Aditya and LA Chmura and R Leich and PP Seitz and B Quak",

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doi = "doi:10.1109/ICHVE.2010.5640762",

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publisher = "IEEE Society",

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}

Erbrink, JJ, Gulski, E, Smit, JJ, Aditya, J, Chmura, LA, Leich, R, Seitz, PP & Quak, B 2010, Test procedure and test circuit considerations for on load tap changer dynamics resistance measurement. in s.n. (ed.), 2010 International conference on high voltage engineering and application (ICHVE). IEEE Society, Piscataway, pp. 317-320, 2010 International conference on high voltage engineering and application (ICHVE), New Orleans, 11/10/10. https://doi.org/doi:10.1109/ICHVE.2010.5640762

Test procedure and test circuit considerations for on load tap changer dynamics resistance measurement. / Erbrink, JJ; Gulski, E; Smit, JJ et al.
2010 International conference on high voltage engineering and application (ICHVE). ed. / s.n. Piscataway: IEEE Society, 2010. p. 317-320.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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T1 - Test procedure and test circuit considerations for on load tap changer dynamics resistance measurement

AU - Erbrink, JJ

AU - Gulski, E

AU - Smit, JJ

AU - Aditya, J

AU - Chmura, LA

AU - Leich, R

AU - Seitz, PP

AU - Quak, B

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N2 - Resistance measurements on power transformers are offline diagnostic methods that are performed without opening the transformer main tank. In case the power transformer is equipped with an on-load tap changer (OLTC), this resistance measurement can be used to find degradation and defects inside the OLTC. Many OLTC defects as well as contact degradation can be measured by means of dynamic resistance measurements, which is a resistance test during OLTC operation. A low (DC) test current through the on-load tap changer is used during dynamic resistance measurements. This method is in particular sensitive to maintenance errors, contact degradation and contact timing problems. In general, distinction can be made between defects that interrupt the current through the OLTC, defects that affect the timing of the OLTC contacts and contact degradation resulting in abnormal contact resistance.

AB - Resistance measurements on power transformers are offline diagnostic methods that are performed without opening the transformer main tank. In case the power transformer is equipped with an on-load tap changer (OLTC), this resistance measurement can be used to find degradation and defects inside the OLTC. Many OLTC defects as well as contact degradation can be measured by means of dynamic resistance measurements, which is a resistance test during OLTC operation. A low (DC) test current through the on-load tap changer is used during dynamic resistance measurements. This method is in particular sensitive to maintenance errors, contact degradation and contact timing problems. In general, distinction can be made between defects that interrupt the current through the OLTC, defects that affect the timing of the OLTC contacts and contact degradation resulting in abnormal contact resistance.

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