The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data

S Van Aert, S Bals, L.Y Chang, AJ den Dekker, A.I Kirkland, D Van Dijck, G Van Tendeloo

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	Undefined/Unknown
Title of host publication	EMC 2008
Editors	Luysberg,M, Tillmann,K, Weirich,T
Place of Publication	Berlin-Heidelberg
Publisher	Springer
Pages	97-98
Number of pages	862
ISBN (Print)	978-3-540-85156-1
Publication status	Published - 2008

Keywords

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title = "The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data",

keywords = "Geen BTA classificatie",

author = "{Van Aert}, S and S Bals and L.Y Chang and {den Dekker}, AJ and A.I Kirkland and {Van Dijck}, D and {Van Tendeloo}, G",

year = "2008",

language = "Undefined/Unknown",

isbn = "978-3-540-85156-1",

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editor = "Luysberg,M and Tillmann,K and Weirich,T",

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TY - CHAP

T1 - The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data

AU - Van Aert, S

AU - Bals, S

AU - Chang, L.Y

AU - den Dekker, AJ

AU - Kirkland, A.I

AU - Van Dijck, D

AU - Van Tendeloo, G

PY - 2008

Y1 - 2008

KW - Geen BTA classificatie

M3 - Chapter

SN - 978-3-540-85156-1

SP - 97

EP - 98

BT - EMC 2008

A2 - Luysberg,M, null

A2 - Tillmann,K, null

A2 - Weirich,T, null

PB - Springer

CY - Berlin-Heidelberg

ER -