Thermal transient behavior of silicon-on-glass BJTs

S Russo; L la Spina; V d' Alessandro; N Rinaldi; M de Magistris; LK Nanver

Thermal transient behavior of silicon-on-glass BJTs

S Russo, L la Spina, V d' Alessandro, N Rinaldi, M de Magistris, LK Nanver

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

7 Citations (Scopus)

Original language	English
Title of host publication	Proceeding of 10th. IEEE International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE 2009)
Editors	s.n.
Place of Publication	s.l.
Publisher	IEEE
Pages	93-100
Number of pages	8
Publication status	Published - 2009
Event	EuroSimE 2009: 10th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems - Delft, Netherlands Duration: 27 Apr 2009 → 29 Apr 2009 Conference number: 10

Conference

Conference	EuroSimE 2009
Country/Territory	Netherlands
City	Delft
Period	27/04/09 → 29/04/09

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{15826c711a4d4d68a3ed308761385e0a,

title = "Thermal transient behavior of silicon-on-glass BJTs",

keywords = "Conf.proc. > 3 pag",

author = "S Russo and {la Spina}, L and {d' Alessandro}, V and N Rinaldi and {de Magistris}, M and LK Nanver",

year = "2009",

language = "English",

pages = "93--100",

editor = "s.n.",

booktitle = "Proceeding of 10th. IEEE International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE 2009)",

publisher = "IEEE",

address = "United States",

note = "EuroSimE 2009 : 10th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems ; Conference date: 27-04-2009 Through 29-04-2009",

}

Russo, S, la Spina, L, d' Alessandro, V, Rinaldi, N, de Magistris, M & Nanver, LK 2009, Thermal transient behavior of silicon-on-glass BJTs. in s.n. (ed.), Proceeding of 10th. IEEE International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE 2009). IEEE, s.l., pp. 93-100, EuroSimE 2009, Delft, Netherlands, 27/04/09.

Thermal transient behavior of silicon-on-glass BJTs. / Russo, S; la Spina, L; d' Alessandro, V et al.
Proceeding of 10th. IEEE International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE 2009). ed. / s.n. s.l.: IEEE, 2009. p. 93-100.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Thermal transient behavior of silicon-on-glass BJTs

AU - Russo, S

AU - la Spina, L

AU - d' Alessandro, V

AU - Rinaldi, N

AU - de Magistris, M

AU - Nanver, LK

N1 - Conference code: 10

PY - 2009

Y1 - 2009

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 93

EP - 100

BT - Proceeding of 10th. IEEE International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE 2009)

A2 - s.n., null

PB - IEEE

CY - s.l.

T2 - EuroSimE 2009

Y2 - 27 April 2009 through 29 April 2009

ER -