Thermionic Emission as a tool of study transport in undoped nFinFETs

GC Tettamanzi, A. Paul, GP Lansbergen, J Verduijn, S Lee, N Collaert, S Biesemans, G Klimeck, S Rogge

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Journal	IEEE Electron Device Letters
Publication status	Published - 2010

Keywords

@article{22aa04840d494380804739cad67f3b8f,

title = "Thermionic Emission as a tool of study transport in undoped nFinFETs",

keywords = "CWTS JFIS >= 2.00",

author = "GC Tettamanzi and A. Paul and GP Lansbergen and J Verduijn and S Lee and N Collaert and S Biesemans and G Klimeck and S Rogge",

year = "2010",

language = "Undefined/Unknown",

journal = "IEEE Electron Device Letters",

issn = "0741-3106",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

}

TY - JOUR

T1 - Thermionic Emission as a tool of study transport in undoped nFinFETs

AU - Tettamanzi, GC

AU - Paul, A.

AU - Lansbergen, GP

AU - Verduijn, J

AU - Lee, S

AU - Collaert, N

AU - Biesemans, S

AU - Klimeck, G

AU - Rogge, S

PY - 2010

Y1 - 2010

KW - CWTS JFIS >= 2.00

M3 - Article

SN - 0741-3106

JO - IEEE Electron Device Letters

JF - IEEE Electron Device Letters

ER -